SurfaceChar LLC
8 Manns Hill Crescent
Sharon, MA 02067
(973) 903 0660
info@surfacechar.com

November 13-14, 2018 Overview of AFM Training Course - 2 spots left!
WHERE:  Oxford Instruments North America HQ, 300 Baker Avenue Extension, Concord MA
Registration deadline extended to Thursday, November 8th

Course overview

This AFM/SPM training course is a practical, hands-on course to teach the principles of operation, basic and advanced imaging modes, and overall capabilities of atomic force microscopy/scanning probe microscopy. In lectures interwoven with labs on a variety of samples, students will learn, understand, and operate state-of-the-art microscopes.  

Topics include:  AFM hardware and associated non-idealities, common imaging artifacts, best practices, software and image processing, sample preparation, cantilever selection, resonant and non-resonant imaging modes, static and dynamic force spectroscopy, contact mechanics models, multifrequency  methods, and more.

Hands-on laboratory sessions will be conducted on Asylum Research Cypher and MFP-3D instrumentation.

Course Fee:  $1550 industrial; $750 graduate students and postdocs - REGISTRATION PAYMENT BELOW!

Hotel information:  There are two hotels conveniently located for this class.

1) Residence Inn by Marriott Concord Boston. This hotel is walking distance from the class.  Please call the hotel directly for a reservation and ask for Oxford Instruments rate.

2) Best Western at historic Concord.

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AFM Course Registration Fee - Select One
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Previous courses offered by SurfaceChar listed below:

We offer customized, onsite courses for customers with many options for topics and duration.  Please contact us at classes@surfacechar.com with your course needs!

Previous courses offered by SurfaceChar:
Survey of Materials Characterization  [March 2018, Pittcon]
Nanomechanical Characterization with AFM [Sep 2017, MIT]
Nanoscale Materials Characterization [May 2017, Nanotech meeting]
Practical short course on atomic force microscopy: A hands-on laboratory short course designed for AFM users on theory, practical implementation, and best practices [Nov 2016, MIT]
Overview of scanning probe microscopy [July 2016, Tel Aviv University]
Overview, technology and applications of AFM to polymers and materials science [May 2016 Boston]
Overview of AFM:  Technology, operation, and applications [April 2016, Netherlands]
How to make the most of your AFM measurements [Sept 2015, MIT]
Nanoscale Characterization for BioMed/Pharma [June 2015, NSTI conference]
Overview of AFM and Advanced Imaging Modes [May 2015, National Taiwan University]
AFM for Polymer Applications [April, 2015, Boston]
Atomic force microscopy, a toolkit for nanotechnology characterization [March 2015, Pittcon conference]

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