SurfaceChar LLC
8 Manns Hill Crescent
Sharon, MA 02067
(973) 903 0660

March 20-22, 2018 AFM Training Course, held in conjunction with Hooke College of Applied Sciences

WHEN:  Tuesday-Thursday, March 20-22, 2018
WHERE:  Hooke College of Applied Sciences, McCrone Group, Westmont IL

We are excited to be partnering with Hooke College of Applied Sciences through the McCrone Group to be offering this intensive, laboratory based training course.

Course overview

This overview of AFM/SPM is a practical, hands-on course to teach the principles of operation, basic and advanced imaging modes, and overall capabilities of atomic force microscopy/scanning probe microscopy. In lectures interwoven with labs on a variety of samples, students will learn, understand, and operate state-of-the-art microscopes.  We will answer questions such as:

What properties can AFM measure?

What is the resolution of AFM and what is it limited by?

What are some of the different AFM instrument designs and what are the pros/cons of each?

What are the sample and environmental limitations for AFM?

What are the different modes of operation?

How do you choose a cantilever for your experiment?

How do you measure modulus and adhesion with AFM? How accurate are these measurements?

What is the state of the art in AFM imaging and quantitative measurements?

My topography seems to depend on my imaging parameters – why is that and how do I fix it?

Why do I see contrast reversal?

Which parameters are important for operation and how do you optimize them?

What calibrations are necessary and how do you perform them?

Artifact recognition

Best practices

This AFM/SPM course provides a foundation for students in the operation of atomic force microscopes to understand (and be able to select appropriately) the various modes and how best to operate the microscope by understanding the operating principles. At the end of the course, students will be able to set up an imaging experiment and run basic static and dynamic AFM modes. They will also gain an understanding of the various imaging parameters involved and how to optimize the parameters for best imaging results. Some advanced topics such as advanced imaging modes and simulation capabilities are also covered to provide students with a comprehensive background to the field. Finally, students will learn the various image processing tools available to properly analyze and interpret their images.

Course fee: $1750.  Due to the laboratory nature of this course, class size is limited so early registration is recommended. 

Full course details and registration info can be found at
Please email us at classes@ with any further questions. 
Survey Materials Characterization Courses co-taught with Greg Haugstad
Previous courses offered by SurfaceChar listed below:

We offer customized, onsite courses for customers with many options for topics and duration.  Please contact us at with your course needs!

Previous courses offered by SurfaceChar:
Nanomechanical Characterization with AFM [Sep 2017, MIT]
Nanoscale Materials Characterization [May 2017, Nanotech meeting]
Practical short course on atomic force microscopy: A hands-on laboratory short course designed for AFM users on theory, practical implementation, and best practices [Nov 2016, MIT]
Overview of scanning probe microscopy [July 2016, Tel Aviv University]
Overview, technology and applications of AFM to polymers and materials science [May 2016 Boston]
Overview of AFM:  Technology, operation, and applications [April 2016, Netherlands]
How to make the most of your AFM measurements [Sept 2015, MIT]
Nanoscale Characterization for BioMed/Pharma [June 2015, NSTI conference]
Overview of AFM and Advanced Imaging Modes [May 2015, National Taiwan University]
AFM for Polymer Applications [April, 2015, Boston]
Atomic force microscopy, a toolkit for nanotechnology characterization [March 2015, Pittcon conference]

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