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Surfaces and Interfaces

ADVANCED Measurement and Characterization

specializing in scanning probe microscopy (SPM), atomic force microscopy (AFM), nanoindentation for industry and research

AFM, SPM and Nanoindentation measurements on state of the art equipment
We are the premier SPM and AFM training service with over a dozen courses offered
Science writing in a variety of technical fields including articles and applications notes
Check out Dalia's Yablon's SPM and AFM blogs on Microscopy and Analysis!
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