Advanced Measurement Services - AFM, SPM, Nanoindentation, Surface Properties - for Industry & Research
SurfaceChar offers a complete measurement service in all atomic force microscopy (AFM) and scanning probe microscopy (SPM) modes as well as nanoindentation with state of the art facilities. Decades of experience in material and life sciences applications.
Get in touch with us today.
AFM and SPM
All major modes including:
- Tapping mode
- Phase imaging
- Bimodal/multifrequency methods
- Contact mode/lateral force mode
- Static force spectroscopy
- Force volume imaging
- Dynamic force spectroscopy
- Magnetic force microscopy
- Kelvin probe microscopy
- Electrostatic force microscopy
- AFM-IR
Nanoindentation
All major measurements:
- Quasistatic testing
- Dynamic measurements
- Scratch testing
- Wear testing
- Properties including:
- Youngs modulus
- Hardness
- Viscoelastic parameters E', E", loss tangent
Surface properties on the nanoscale
- Topography
- Roughness
- Materials contrast
- Adhesion
- Stiffness
- Elastic properties (modulus)
- Magnetic properties
- Electrical properties
Analysis and reports included with all measurements
Statistical analysis, material properties, contact mechanics model fitting, image processing as well as data interpretation are all options that can be included.
- Quantitative roughness analysis
- Particle sizing analysis
- 3-D visualization
- Overlaying of multiple channels
- Force curve fitting and analysis
To inquire about measurement services, please fill out the form here or email us!